Enabling javascript will improve the functionality of this page. skip to content
Lehman College

Catalog search


Catalog links

print page

GEP 606: Raster Analysis.

4 hours, 3 credits (2 hours, lecture; 2 hours, lab). Focusing on the structure and the various ways in which raster data can be created, modified, and analyzed using a Geographic Information System (GIS). Topics include surface analysis, multi-criteria/multi-objective evaluation, and map algebra. The course combines lectures with weekly laboratory exercises designed to apply the concepts from the lectures and to develop students' expertise with GIS processing software. PREREQ: GEP 205 or instructor's permission.

Last modified: 3/11/2014